Publications


2004

[8] F. Giustino, A. Bongiorno, and A. Pasquarello
Electronic structure at realistic Si(100)-SiO2 interfaces
Jap. J. of Appl. Phys. 43, 7895 (2004)

[7] F. Giustino, A. Bongiorno, and A. Pasquarello
Atomic-scale modelling of the Si(100)-SiO2 interface
27th International Conference on the Physics of Semiconductors, AIP Conference Proceedings, ed. by J. MenÚndez and C.G. Van de Walle (AIP, Melville, 2005), Vol. 772, p. 423

[6] F. Giustino, P. Umari, and A. Pasquarello
Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-K oxides
Microel. Eng. 72, 300 (2004)


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