Publications


2005

[15] F. Giustino and A. Pasquarello
Infrared spectra at surfaces and interfaces from first principles:evolution of the spectra across the Si(100)-SiO2 interface
Phys. Rev. Lett. 95, 187402 (2005)

[14] F. Giustino and A. Pasquarello
Equivalent oxide thickness of a thin oxide interlayer in gate insulator stacks on silicon
Appl. Phys. Lett. 86, 192101 (2005)

[13] F. Giustino and A. Pasquarello
Theory of atomic-scale dielectric permittivity at insulator interfaces
Phys. Rev. B 71, 144104 (2005)

[12] F. Devynck, F. Giustino, and A. Pasquarello
Abrupt model interface for the 4H(1000)SiC-SiO2 interface
Microel. Eng. 80, 38 (2005)

[11] F. Giustino and A. Pasquarello
Infrared properties of ultrathin oxides on Si(100)
Microel. Eng. 80, 420 (2005)

[10] F. Giustino, A. Bongiorno, and A. Pasquarello
Atomistic models of the Si(100)-SiO2 interface: structural electronic and dielectric properties
J. Phys.: Condens. Matter. 17, S2065 (2005)

[9] F. Giustino and A. Pasquarello
Electronic and dielectric properties of a suboxide interlayer at the silicon/oxide interface in MOS devices
Surf. Sci. 586, 183 (2005)


Recent Publications | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002